Random Vs Deterministic Test Pattern Generation

Random Test Pattern Generation – RTPG

Deterministic Test Pattern Generation – DTPG

RTPG can never identify redundant faults while DTPG does. However, it can be useful on testable faults terminated by DTPG. Hence, as an initial step using a small number of random patterns can improve ATPG performance.

The very definition of RTPG and DTPG can prove the above statement. In DTPG, also called ATPG, there are some algorithms used to find a pattern that detects a particular fault. These ATPG algorithms have the ability to find if a fault is redundant or not. There are algorithms(called Redundancy Identification RID algorithms) which analyze the circuit without targeting any specific faults and can find many, but not all, redundant faults.

Whereas RTPG, like in Logic BIST, applies random vectors and tries to choose the best minimum possible patterns targeting a particular fault coverage. (The coverage of random patterns is observed to saturate between 60-80% of coverage)

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